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Item Details Feature
Failure
Analysis
  • Decapsulation Devices for Faillure Analysis
  • Low Temperature Decapsulation
  • Chemical and Plasma Decapsulation
  • No Damaging to Copper Wire
EL-INSPECTION
  • PV Cell Property Inspection using Light after flowing electronical currents through
  • Accurate & Rapid Inspection
  • High Reliability
Laser & Chemical Decapsulation
Wet Chemisty
  • Drop technique or automated decapsulator
  • Positive or Negative pressure
  • Nitric acid (HNO3) 65 a 90℃
  • Sulfuric acid (H2SO4) 140 a 255℃
  • Acid mix 27 a 100℃
Dry chemistry
  • RF Plasma enclosure
  • 02 / CF4 then 02 or Ar
  • N2 or CO2 blowing
Mecanical : Milling
LASER Ablation
Decap methods : Working Together
EL Inspection / EL Sorter